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1997•Journal of Applied PhysicsRequires access

Emissivity of liquid silicon in visible and infrared regions

Eiryo Takasuka, Eiji Tokizaki, Kazutaka Terashima, Shigeyuki Kimura

Open publisher page 48 citations

Abstract

Normal spectral emissivity of Si melt in visible and infrared regions was determined by the direct measurement of thermal radiations from the melt and a blackbody cavity which was located close to the melt. The spectral emissivity slightly decreases with wavelength. The emissivity slightly changes with temperature. The spectral emissivity values in visible and in infrared region are 0.27 and 0.21, respectively. The wavelength dependence of the emissivity can be interpreted by a dielectric response of free electrons in the melt.

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What this paper is about

Normal spectral emissivity of Si melt in visible and infrared regions was determined by the direct measurement of thermal radiations from the melt and a blackbody cavity which was located close to the melt. The spectral emissivity slightly decreases with wavelength. The emissivity slightly changes with temperature. The spectral emissivity values in visible and in infrared region are 0.27 and 0.21, respectively. The wavelength dependence of the emissivity can be interpreted by a dielectric response of free electrons in the melt.

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Available abstract

Normal spectral emissivity of Si melt in visible and infrared regions was determined by the direct measurement of thermal radiations from the melt and a blackbody cavity which was located close to the melt. The spectral emissivity slightly decreases with wavelength. The emissivity slightly changes with temperature. The spectral emissivity values in visible and in infrared region are 0.27 and 0.21, respectively. The wavelength dependence of the emissivity can be interpreted by a dielectric response of free electrons in the melt.

Key concepts: Emissivity, Black-body radiation, Infrared, Materials science, Low emissivity, Wavelength, Silicon, Optics

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