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2008•Journal of Materials ScienceOpen access

Morphology and constitution of the compound layer formed on nitrided Fe–4wt.%V alloy

Santosh S. Hosmani, R. E. Schacherl, E. J. Mittemeijer

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Abstract

The microstructure of the compound (“white”) layer formed on the surface of Fe–4wt.%V alloy, by nitriding in a gas mixture of ammonia and hydrogen at 580 °C, has been investigated by employing light and scanning electron microscopy, X-ray diffraction and electron probe microanalysis. The compound layer is dominantly composed of γ | -Fe 4 N nitride. Quantitative analysis of the composition data demonstrated that V is present in the compound layer as VN precipitates, i.e. V is not taken up significantly in (Fe, V) nitrides. A mechanism for compound-layer formation has been proposed.

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The microstructure of the compound (“white”) layer formed on the surface of Fe–4wt.%V alloy, by nitriding in a gas mixture of ammonia and hydrogen at 580 °C, has been investigated by employing light and scanning electron microscopy, X-ray diffraction and electron probe microanalysis. The compound layer is dominantly composed of γ | -Fe 4 N nitride. Quantitative analysis of the composition data demonstrated that V is present in the compound layer as VN precipitates, i.e. V is not taken up significantly in (Fe, V) nitrides. A mechanism for compound-layer formation has been proposed.

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Available abstract

The microstructure of the compound (“white”) layer formed on the surface of Fe–4wt.%V alloy, by nitriding in a gas mixture of ammonia and hydrogen at 580 °C, has been investigated by employing light and scanning electron microscopy, X-ray diffraction and electron probe microanalysis. The compound layer is dominantly composed of γ | -Fe 4 N nitride. Quantitative analysis of the composition data demonstrated that V is present in the compound layer as VN precipitates, i.e. V is not taken up significantly in (Fe, V) nitrides. A mechanism for compound-layer formation has been proposed.

Key concepts: Nitriding, Materials science, Scanning electron microscope, Alloy, Nitride, Microstructure, Microanalysis, Layer (electronics)

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