2005•Thin Solid FilmsRequires access

Electron energy loss spectroscopy, low energy electron diffraction, and auger electron spectroscopy study of Indium overlayers on Si(111) and Si(100) surfaces

Manhui Sun, Chuan Hu, Rui Zhao, Hang Ji

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Key concepts: Auger electron spectroscopy, Indium, Low-energy electron diffraction, Electron diffraction, Electron energy loss spectroscopy, Electron spectroscopy, Reflection high-energy electron diffraction, Energy-dispersive X-ray spectroscopy