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An error analysis of the SYNCANG and SYNCWANG methods for the measurement of film refractive index and thickness

D.J. Walter, Dieter Krause

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Key concepts: Refractive index, Optics, Substrate (aquarium), Materials science, Step-index profile, X-ray optics, Normalized frequency (unit), Observational error

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An error analysis of the SYNCANG and SYNCWANG methods for the measurement of film refractive index and thickness — Research Paper | ScholarLens