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2010•Microscopy and MicroanalysisOpen access

Analysis of Local Texture across Layers in Electron-Beam Melted (EBM) Ti-6Al- 4V via Electron Backscatter Diffraction (EBSD)

Brandon D. Saller, JR Porter, T Van Den Vlekkert, Scott D. Walck

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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What this paper is about

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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OpenAlex reports 1 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Key concepts: Electron backscatter diffraction, Texture (cosmology), Materials science, Diffraction, Microanalysis, Electron diffraction, Cathode ray, Electron microscope

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Analysis of Local Texture across Layers in Electron-Beam Melted (EBM) Ti-6Al- 4V via Electron Backscatter Diffraction (EBSD) — Research Paper | ScholarLens