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2010•Microscopy and MicroanalysisOpen access

Phase Contrast Aberration Corrected Electron Microscope for Phase Plate Imaging

Endre Majorovits, Bastian Barton, Gerd Benner, C Dietl, Werner Kühlbrandt, S. Lengweiler, Thilo Mandler, M Matijevic, H. Niebel, Rasmus R. Schröder

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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What this paper is about

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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OpenAlex reports 3 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Key concepts: Phase contrast microscopy, Electron microscope, Phase-contrast imaging, Contrast transfer function, Phase (matter), Materials science, Optics, Contrast (vision)

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