1990Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access

Sensitivity limits of a short-external-cavity tunable diode laser absorption spectrometer

Brian F. Ventrudo, Daniel T. Cassidy

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Abstract

short-external-cavity (SXC) is used to obtain continuous single-mode operation over 20-50 cm-1 with near-IR semiconductor diode lasers. When the SXC lasers are used as a source in a tunable diode laser absorption spectrometer (TDLAS), very sensitive (~3x10-6 absorbance) trace-gas detection and spectroscopic measurements are possible.

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What this paper is about

short-external-cavity (SXC) is used to obtain continuous single-mode operation over 20-50 cm-1 with near-IR semiconductor diode lasers. When the SXC lasers are used as a source in a tunable diode laser absorption spectrometer (TDLAS), very sensitive (~3x10-6 absorbance) trace-gas detection and spectroscopic measurements are possible.

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Available abstract

short-external-cavity (SXC) is used to obtain continuous single-mode operation over 20-50 cm-1 with near-IR semiconductor diode lasers. When the SXC lasers are used as a source in a tunable diode laser absorption spectrometer (TDLAS), very sensitive (~3x10-6 absorbance) trace-gas detection and spectroscopic measurements are possible.

Key concepts: Tunable diode laser absorption spectroscopy, Spectrometer, Laser, Tunable laser, Diode, Materials science, Semiconductor laser theory, Absorbance

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