1990Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access

Noncontact precision measurement system

Ronald W. Gamache, John Tourtellott, John Wagner

Open publisher page 1 citations

Abstract

A gage is being developed to make precision measurements of moving surfaces in a manufacturing environment. A prototype has demonstrated submicron repeatability and accuracy at the 2- to 6-micron level as well as the ability to measure parts moving at about 1 in./min. The system is described, and the means to make the accuracy comparable to the repeatability and to increase part velocity to more than 200 in./min are indicated.

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What this paper is about

A gage is being developed to make precision measurements of moving surfaces in a manufacturing environment. A prototype has demonstrated submicron repeatability and accuracy at the 2- to 6-micron level as well as the ability to measure parts moving at about 1 in./min. The system is described, and the means to make the accuracy comparable to the repeatability and to increase part velocity to more than 200 in./min are indicated.

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Available abstract

A gage is being developed to make precision measurements of moving surfaces in a manufacturing environment. A prototype has demonstrated submicron repeatability and accuracy at the 2- to 6-micron level as well as the ability to measure parts moving at about 1 in./min. The system is described, and the means to make the accuracy comparable to the repeatability and to increase part velocity to more than 200 in./min are indicated.

Key concepts: Repeatability, System of measurement, Measure (data warehouse), Accuracy and precision, Computer science, Measurement uncertainty, Acoustics, Materials science

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