1989•Journal of Electron Spectroscopy and Related PhenomenaRequires access

XPS stoichiometry measurements on surfaces of III–V crystalline compounds

P. Alnot, J. Olivier, C. S. Fadley

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Key concepts: X-ray photoelectron spectroscopy, Stoichiometry, Allowance (engineering), Diffraction, Single crystal, Analytical Chemistry (journal), Materials science, Chemistry

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