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2012•Applied Surface ScienceRequires access

Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry

Debarati Bhattacharya, S. Basu, Surendra Singh, S. Roy, B. N. Dev

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Key concepts: X-ray reflectivity, Neutron reflectometry, Reflectometry, Materials science, Neutron, Alloy, Silicon, Reflectivity

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Interfacial mixing in as-deposited Si/Ni/Si layers analyzed by x-ray and polarized neutron reflectometry — Research Paper | ScholarLens