2010•Journal of Physics D Applied PhysicsRequires access

Recording performances in perpendicular magnetic patterned media

Mohamed Asbahi, J. Moritz, B. Diény, C. Gourgon, C Perret, R J M van de Veerdonk

Abstract

We report on the recording performances and signal-to-noise ratio (SNR) analyses of perpendicular magnetic bit-patterned media. Two different types of magnetic samples are investigated. They differ by the way that they were patterned (nano-imprint versus e-beam lithography) as well as their magnetic properties (Co/Pt multilayers and CoCrPt alloy are the recording layers).Using a contact read/write quasi-static tester, we were able to characterize the write windows, the bit error rates and measure the SNR. The influence of magnetic properties and media microstructure on the writing processes is studied. We show also that the lithographical method used to replicate the media induces more or less noise due to structural distributions.

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Key concepts: Patterned media, Recording media, Perpendicular recording, Materials science, Perpendicular, Lithography, Microstructure, Signal-to-noise ratio (imaging)