O.S. Heavens
Abstract
A simple method is described for calculating the effect of thickness errors in systems of multilayer dielectric films. The results of its application to systems of low-index-high-index quarter-wave pairs are given.
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A simple method is described for calculating the effect of thickness errors in systems of multilayer dielectric films. The results of its application to systems of low-index-high-index quarter-wave pairs are given.
Key concepts: Dielectric, Optics, Materials science, Simple (philosophy), Index (typography), Refractive index, Optoelectronics, Computer science