2010Advanced materials researchRequires access

Estimation of Failure Probability and its Applications in Reliability Data Analysis

Han Ming

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Abstract

Evaluation method of reliability parameter estimation needs to be improved effectively with the advance of science and technology. This paper develops a new method of parameter estimation, which is named E-Bayesian estimation method. In the case one hyper-parameter, the definition of E-Bayesian estimation of the failure probability is provided, moreover, the formulas of E-Bayesian estimation and hierarchical Bayesian estimation, and the property of E-Bayesian estimation of the failure probability are also provided. Finally, calculation on practical problems shows that the provided method is feasible and easy to perform.

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What this paper is about

Evaluation method of reliability parameter estimation needs to be improved effectively with the advance of science and technology. This paper develops a new method of parameter estimation, which is named E-Bayesian estimation method. In the case one hyper-parameter, the definition of E-Bayesian estimation of the failure probability is provided, moreover, the formulas of E-Bayesian estimation and hierarchical Bayesian estimation, and the property of E-Bayesian estimation of the failure probability are also provided. Finally, calculation on practical problems shows that the provided method is feasible and easy to perform.

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Available abstract

Evaluation method of reliability parameter estimation needs to be improved effectively with the advance of science and technology. This paper develops a new method of parameter estimation, which is named E-Bayesian estimation method. In the case one hyper-parameter, the definition of E-Bayesian estimation of the failure probability is provided, moreover, the formulas of E-Bayesian estimation and hierarchical Bayesian estimation, and the property of E-Bayesian estimation of the failure probability are also provided. Finally, calculation on practical problems shows that the provided method is feasible and easy to perform.

Key concepts: Bayesian probability, Reliability (semiconductor), Estimation, Bayes estimator, Computer science, Bayesian hierarchical modeling, Bayesian average, Data mining

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