D. M. Davies, B. Ralph
Abstract
SUMMARY The design of a simple and robust field‐ion microscope for making routine metallurgical investigations is presented. Particular attention is given to the choice of ancillary facilities such as the cooling and image‐intensifying systems. Examples of the applications of this microscope are given.
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SUMMARY The design of a simple and robust field‐ion microscope for making routine metallurgical investigations is presented. Particular attention is given to the choice of ancillary facilities such as the cooling and image‐intensifying systems. Examples of the applications of this microscope are given.
Key concepts: Field ion microscope, Microscope, Field (mathematics), Materials science, Nanotechnology, Computer science, Ion, Optics