X-ray Photoelectron and Raman Spectra of TMTTF-TCNQ: Estimation of the Valence Fluctuation Time and the Degree of Charge Transfer
M. Tokumoto, Naoki Koshizuka, Hiroyuki Anzai, Takehiko Ishiguro
Abstract
M. Tokumoto, Naoki Koshizuka, Hiroyuki Anzai, Takehiko Ishiguro
Abstract
The X-ray photoelectron and Raman spectra of quasi one-dimensional conductor TMTTF-TCNQ were measured at room temperature. A combined analysis of N 1 s (or S 2 p ) core level XPS spectra and Raman spectra is shown to give a characteristic time scale (τ∼10 -14 sec) of valence fluctuation in this mixed-valence complex. From the Raman frequency of TCNQ ν 4 band, the degree of charge transfer in TMTTF-TCNQ is given to be 0.50±0.05, which is smaller than that in TTF-TCNQ and is close to a commensurate value.
OpenAlex reports 28 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
The X-ray photoelectron and Raman spectra of quasi one-dimensional conductor TMTTF-TCNQ were measured at room temperature. A combined analysis of N 1 s (or S 2 p ) core level XPS spectra and Raman spectra is shown to give a characteristic time scale (τ∼10 -14 sec) of valence fluctuation in this mixed-valence complex. From the Raman frequency of TCNQ ν 4 band, the degree of charge transfer in TMTTF-TCNQ is given to be 0.50±0.05, which is smaller than that in TTF-TCNQ and is close to a commensurate value.
Key concepts: Raman spectroscopy, Valence (chemistry), X-ray photoelectron spectroscopy, Spectral line, Materials science, Analytical Chemistry (journal), Conductor, Atomic physics