A method for rapid in situ measurement of foil thickness in a TEM

SUMMARY A method is described which can be used for rapid in situ determinations of relative foil thicknesses in a transmission electron microscope, and is illustrated for the case of aluminium. A calibration curve for the foil thickness determination was obtained by measuring the relative transmission of electrons through standard thickness foils which were prepared and measured outside the electron microscope. By using this calibration curve, it was merely necessary to measure the relative transmission of electrons through an unknown specimen in order to determine its thickness.