1996•Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access

Surface electromagnetic wave microscopy of opaque samples

A. P. Gorobets, A. P. Loginov, Alexey Konstantinovich Nikitin, А. А. Тищенко

Abstract

We review the ways of performing super high resolution optical microscopy of opaque samples using surface electromagnetic waves (SEW) for the cases when the light signal is detected in the near or in the far field. An immersion method of SEW excitation is presented. The method enables one to perform the superhigh resolution SEW-microscopy of conducting and semi conducting opaque sample surfaces.

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Available abstract

Key concepts: Opacity, Microscopy, Optics, Optical microscope, Materials science, Excitation, Resolution (logic), High resolution