Radar determination of the surface properties of a randomly rough surface
A.K. Fung
Abstract
A.K. Fung
Abstract
This letter conveys a simple method for remote sensing of the surface properties, both physical and geometrical, of a randomly rough surface by means of a polychromatic bistatic radar. Difficulties in evaluating the properties of a randomly rough surface by the conventional method of calculating the scattering cross section or the average power are discussed.
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This letter conveys a simple method for remote sensing of the surface properties, both physical and geometrical, of a randomly rough surface by means of a polychromatic bistatic radar. Difficulties in evaluating the properties of a randomly rough surface by the conventional method of calculating the scattering cross section or the average power are discussed.
Key concepts: Surface (topology), Rough surface, Radar, Radar cross-section, Remote sensing, Surface roughness, Scattering, Simple (philosophy)