Change-point modeling for software reliability assessment depending on two-types of reliability growth factors
Shinji Inoue, Shigeru Yamada
Abstract
Shinji Inoue, Shigeru Yamada
Abstract
We often observe a phenomenon that stochastic characteristics of the software failure-occurrence time or software failure-occurrence time-interval changes notably in an actual testing-phase of a software development process. The testing-time when such phenomenon is observed is called change-point. It is said that the effect of change-point on the software reliability growth process influences accuracy for software reliability assessment based on a software reliability growth model (SRGM). This paper discusses a two-dimensional software reliability growth modeling framework with change-point, in which the software reliability growth process is assumed to depend on the testing-time and testing-effort factors simultaneously. Further, we show examples of the applications of software reliability assessment based on a two-dimensional SRGM developed under our modeling framework by using actual data.
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We often observe a phenomenon that stochastic characteristics of the software failure-occurrence time or software failure-occurrence time-interval changes notably in an actual testing-phase of a software development process. The testing-time when such phenomenon is observed is called change-point. It is said that the effect of change-point on the software reliability growth process influences accuracy for software reliability assessment based on a software reliability growth model (SRGM). This paper discusses a two-dimensional software reliability growth modeling framework with change-point, in which the software reliability growth process is assumed to depend on the testing-time and testing-effort factors simultaneously. Further, we show examples of the applications of software reliability assessment based on a two-dimensional SRGM developed under our modeling framework by using actual data.
Key concepts: Reliability engineering, Software reliability testing, Software quality, Computer science, Reliability (semiconductor), Software development, Regression testing, Software performance testing