AlGaN ultraviolet photoconductors grown on sapphire
D. Walker, X. Zhang, Patrick Kung, A. Saxler, Sirus Javadpour, Jiao Xu, M. Razeghi
Abstract
D. Walker, X. Zhang, Patrick Kung, A. Saxler, Sirus Javadpour, Jiao Xu, M. Razeghi
Abstract
AlxGa1−xN (0≤x≤0.50) ultraviolet photoconductors with a minimum cutoff wavelength shorter than 260 nm have been fabricated and characterized. The AlGaN active layers were grown on (00⋅1) sapphire substrates by metalorganic chemical vapor deposition (MOCVD). The spectral responsivity of the GaN detector at 360 nm is about 1 A/W biased at 8 V at room temperature. The carrier lifetime derived from the voltage-dependent responsivity is 0.13–0.36 ms.
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AlxGa1−xN (0≤x≤0.50) ultraviolet photoconductors with a minimum cutoff wavelength shorter than 260 nm have been fabricated and characterized. The AlGaN active layers were grown on (00⋅1) sapphire substrates by metalorganic chemical vapor deposition (MOCVD). The spectral responsivity of the GaN detector at 360 nm is about 1 A/W biased at 8 V at room temperature. The carrier lifetime derived from the voltage-dependent responsivity is 0.13–0.36 ms.
Key concepts: Responsivity, Sapphire, Ultraviolet, Metalorganic vapour phase epitaxy, Chemical vapor deposition, Optoelectronics, Materials science, Photodetector