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Constant‐Distance Mode Scanning Electrochemical Microscopy. Part II: High‐Resolution SECM Imaging Employing Pt Nanoelectrodes as Miniaturized Scanning Probes

Bernardo Ballesteros Katemann, Albert Schulte, Wolfgang W. Schuhmann

Abstract

Abstract The potential of needle‐type Pt disk nanoelectrodes as extremely miniaturized scanning probes for high resolution scanning electrochemical microscopy (SECM) was investigated. The accuracy of a piezoelectric shear‐force based distance control allowed a precise positioning of the Pt nanoelectrodes in close proximity to the surface of interest not only in tip approach experiments but also throughout scanning and SECM imaging. As proof of the advanced quality of SECM imaging, high‐resolution current and topography images of a three‐dimensional LIGA microstructure will be presented both simultaneously acquired by operating Pt nanoelectrodes in the constant‐distance mode of SECM.

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Available abstract

Key concepts: Scanning electrochemical microscopy, Materials science, Resolution (logic), LIGA, Scanning probe microscopy, Microscopy, Optics, Nanotechnology