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2010•UltramicroscopyOpen access

Fabrication and characterization of low aberration micrometer-sized electron lenses

Elvira Steinwand, Jean-Nicolas Longchamp, Hans‐Werner Fink

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Key concepts: Optics, Electrostatic lens, Lens (geology), Spherical aberration, Paraxial approximation, Contrast transfer function, Electron optics, Electron

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