A new op-amp noise model for switched-capacitor sigma-delta modulator in SIMULINK
Feng Wu, Z.J. Chen, Meng Zhao, Dongyuan Xu, Guangchong Shen, Wengao Lu, Yingcong Zhang
Abstract
Feng Wu, Z.J. Chen, Meng Zhao, Dongyuan Xu, Guangchong Shen, Wengao Lu, Yingcong Zhang
Abstract
Precise behavioral models are needed to simulate switched-capacitor sigma-delta modulators more efficiently. This paper presents a new noise model of the operational amplifier (op-amp) used in a typical correlated double sampling (CDS) integrator. Evaluation and validation of the new model are done via behavioral and transistor-level simulations for a 2-1 MASH modulator using SIMULINK and SPECTRE with 0.35um CMOS technology. Two sets of results for comparison are obtained and the biggest difference between the two simulators is around 2dB.
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Precise behavioral models are needed to simulate switched-capacitor sigma-delta modulators more efficiently. This paper presents a new noise model of the operational amplifier (op-amp) used in a typical correlated double sampling (CDS) integrator. Evaluation and validation of the new model are done via behavioral and transistor-level simulations for a 2-1 MASH modulator using SIMULINK and SPECTRE with 0.35um CMOS technology. Two sets of results for comparison are obtained and the biggest difference between the two simulators is around 2dB.
Key concepts: Delta-sigma modulation, Switched capacitor, Integrator, Operational amplifier, CMOS, Electronic engineering, Capacitor, Noise (video)