Hard X-ray Microprobe and Scanning Microscopy with Spherical-Aberration-Corrected Grazing-Incident Spherical-Concave Mirror Optics
Yoshio Suzuki, Akihisa Takeuchi
Abstract
Open-access reader
Yoshio Suzuki, Akihisa Takeuchi
Abstract
Open-access reader
Total-reflection mirror optics with four spherical-concave mirrors has been developed for hard X-ray microfocusing. The optical system consists of a pair of tandem spherical-concave mirrors. Each tandem-mirror system is assembled to eliminate spherical aberration of gazing-incident optics with spherical mirrors, and the two tandem-mirror systems are combined in a crossed-mirror geometry in order to achieve two-dimensional focusing. Characterization of the quad-mirror system as an X-ray focusing device was performed at beamline 20XU of SPring-8. The focused beam size at an X-ray energy of 10 keV was measured to be 170×190 nm2 in full-width at half-maximum, and the X-ray energy dependence of focusing properties was evaluated in the energy range from 8 to 14 keV. Preliminary experiments on scanning microscopy were also carried out.
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Total-reflection mirror optics with four spherical-concave mirrors has been developed for hard X-ray microfocusing. The optical system consists of a pair of tandem spherical-concave mirrors. Each tandem-mirror system is assembled to eliminate spherical aberration of gazing-incident optics with spherical mirrors, and the two tandem-mirror systems are combined in a crossed-mirror geometry in order to achieve two-dimensional focusing. Characterization of the quad-mirror system as an X-ray focusing device was performed at beamline 20XU of SPring-8. The focused beam size at an X-ray energy of 10 keV was measured to be 170×190 nm2 in full-width at half-maximum, and the X-ray energy dependence of focusing properties was evaluated in the energy range from 8 to 14 keV. Preliminary experiments on scanning microscopy were also carried out.
Key concepts: Optics, Spherical aberration, Curved mirror, Plane mirror, Physics, Beamline, X-ray optics, X-ray