1990High Pressure ResearchRequires access

High resolution X-ray diffraction studies at high pressures

J. S. Loveday, R. J. Nelmes, M. I. McMahon

Open publisher page 2 citations

Abstract

The principal sources of systematic error in high-pressure x-ray structure determination with a diamond anvil cell have been studied in detail. The results of these studies have been used to develop techniques to minimise or correct for these effects.

About this research paper

What this paper is about

The principal sources of systematic error in high-pressure x-ray structure determination with a diamond anvil cell have been studied in detail. The results of these studies have been used to develop techniques to minimise or correct for these effects.

Why it matters

OpenAlex reports 2 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

The principal sources of systematic error in high-pressure x-ray structure determination with a diamond anvil cell have been studied in detail. The results of these studies have been used to develop techniques to minimise or correct for these effects.

Key concepts: Diamond anvil cell, Diffraction, X-ray crystallography, High pressure, Materials science, High resolution, Diamond, Crystallography

Related papers

Back to paper searchBrowse research topicsOriginal source
High resolution X-ray diffraction studies at high pressures — Research Paper | ScholarLens