2001Materials science forumOpen access

Thermopower Measurements in 4H-SiC and Theoretical Calculations Considering the Phonon Drag Effect

V. Grivickas, M. Stölzer, Enn Velmre, Andres Udal, Paulius Grivickas, Mikael Syväjärvi, Rositza Yakimova, V. Bikbajevas

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Abstract

The Seebeck coefficient study in a heavily nitrogen-doped n-type 4H-SiC epilayer in the direction perpendicular to c-axis is presented. The Seebeck coefficient steeply increases from 0.56 mV/K to 1.7 mV/K with decreasing temperature in the range 400-80 R. This behavior is explained by the phonon drag effect. An approach to the theoretical modeling of the phonon drag effect is discussed and simulation of the Seebeck coefficient temperature-dependence is displayed.

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The Seebeck coefficient study in a heavily nitrogen-doped n-type 4H-SiC epilayer in the direction perpendicular to c-axis is presented. The Seebeck coefficient steeply increases from 0.56 mV/K to 1.7 mV/K with decreasing temperature in the range 400-80 R. This behavior is explained by the phonon drag effect. An approach to the theoretical modeling of the phonon drag effect is discussed and simulation of the Seebeck coefficient temperature-dependence is displayed.

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Available abstract

The Seebeck coefficient study in a heavily nitrogen-doped n-type 4H-SiC epilayer in the direction perpendicular to c-axis is presented. The Seebeck coefficient steeply increases from 0.56 mV/K to 1.7 mV/K with decreasing temperature in the range 400-80 R. This behavior is explained by the phonon drag effect. An approach to the theoretical modeling of the phonon drag effect is discussed and simulation of the Seebeck coefficient temperature-dependence is displayed.

Key concepts: Phonon drag, Seebeck coefficient, Materials science, Condensed matter physics, Phonon, Drag coefficient, Thermoelectric effect, Drag

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