Transport-of-intensity approach to differential interference contrast (TI-DIC) microscopy for quantitative phase imaging
Shan Shan Kou, Laura Waller, George Barbastathis, Colin J. R. Sheppard
Abstract
Shan Shan Kou, Laura Waller, George Barbastathis, Colin J. R. Sheppard
Abstract
Differential interference contrast (DIC) microscopy is an inherently qualitative phase-imaging technique. What is obtained is an image with mixed phase-gradient and amplitude information rather than a true linear mapping of actual optical path length (OPL) differences. Here we investigate an approach that combines the transport-of-intensity equation (TIE) with DIC microscopy, thus improving direct visual observation. There is little hardware modification and the computation is noniterative. Numerically solving for the propagation of light in a series of through-focus DIC images allows linear phase information in a single slice to be completely determined and restored from DIC intensity values.
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Differential interference contrast (DIC) microscopy is an inherently qualitative phase-imaging technique. What is obtained is an image with mixed phase-gradient and amplitude information rather than a true linear mapping of actual optical path length (OPL) differences. Here we investigate an approach that combines the transport-of-intensity equation (TIE) with DIC microscopy, thus improving direct visual observation. There is little hardware modification and the computation is noniterative. Numerically solving for the propagation of light in a series of through-focus DIC images allows linear phase information in a single slice to be completely determined and restored from DIC intensity values.
Key concepts: Differential interference contrast microscopy, Optics, Microscopy, Interference (communication), Interference microscopy, Phase (matter), Phase-contrast imaging, Optical microscope