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A simulation of the angle resolved Auger yield from Al(001)

Richard D. Rydgren, H. F. Helbig, C. A. Moyer

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Key concepts: Auger, Auger electron spectroscopy, Auger effect, Atomic physics, Electron, Yield (engineering), Monte Carlo method, Electron spectroscopy

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A simulation of the angle resolved Auger yield from Al(001) — Research Paper | ScholarLens