Voltage and Frequency Dependence of Differential Capacitance in Relaxed In0.2Ga0.8As/GaAs Schottky Diodes
Jenn-Fang Chen, N. C. Chen, Jiin-Shung Wang, Pai-Yong Wang
Abstract
Open-access reader
Jenn-Fang Chen, N. C. Chen, Jiin-Shung Wang, Pai-Yong Wang
Abstract
Open-access reader
Capacitance dispersion over frequency is investigated for relaxed In0.2Ga0.8As/GaAs Schottky diodes. While the high-frequency capacitance is voltage-independent, the low-frequency capacitance is seen to decrease with reverse voltage. Based on a Schottky barrier combined with a high-resistance layer containing traps, a simplified equation for the differential capacitance is derived to explain the capacitance-voltage-frequency relation. It is found that the high-frequency capacitance corresponds to the total thickness of the Schottky depletion and the high-resistance layer, while the low-frequency capacitance at a small reverse voltage is the Schottky depletion capacitance and at a large reverse voltage is the high-frequency capacitance.
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Capacitance dispersion over frequency is investigated for relaxed In0.2Ga0.8As/GaAs Schottky diodes. While the high-frequency capacitance is voltage-independent, the low-frequency capacitance is seen to decrease with reverse voltage. Based on a Schottky barrier combined with a high-resistance layer containing traps, a simplified equation for the differential capacitance is derived to explain the capacitance-voltage-frequency relation. It is found that the high-frequency capacitance corresponds to the total thickness of the Schottky depletion and the high-resistance layer, while the low-frequency capacitance at a small reverse voltage is the Schottky depletion capacitance and at a large reverse voltage is the high-frequency capacitance.
Key concepts: Differential capacitance, Capacitance, Schottky diode, Materials science, Optoelectronics, Varicap, Depletion region, Schottky barrier