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1990•IEEE Transactions on Computer-Aided Design of Integrated Circuits and SystemsRequires access

Probabilistic simulation for reliability analysis of CMOS VLSI circuits

Farid N. Najm, Richard Burch, Ping Yang, Ibrahim N. Hajj

Open publisher page 212 citations

Abstract

A current-estimation approach to support the analysis of electromigration (EM) failures in power supply and ground buses of CMOS VLSI circuits is discussed. It uses the original concept of probabilistic simulation to efficiently generate accurate estimates of the expected current waveform required for electromigration analysis. Thus, the approach is pattern-independent and relieves the designer of the tedious task of specifying logical input waveforms. This approach has been implemented in the program CREST (current estimator) which has shown excellent accuracy and dramatic speedups compared with traditional approaches. The approach and its implementation are described, and the results of numerous CREST runs on real circuits are presented.>

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What this paper is about

A current-estimation approach to support the analysis of electromigration (EM) failures in power supply and ground buses of CMOS VLSI circuits is discussed. It uses the original concept of probabilistic simulation to efficiently generate accurate estimates of the expected current waveform required for electromigration analysis. Thus, the approach is pattern-independent and relieves the designer of the tedious task of specifying logical input waveforms. This approach has been implemented in the program CREST (current estimator) which has shown excellent accuracy and dramatic speedups compared with traditional approaches. The approach and its implementation are described, and the results of numerous CREST runs on real circuits are presented.>

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OpenAlex reports 212 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

A current-estimation approach to support the analysis of electromigration (EM) failures in power supply and ground buses of CMOS VLSI circuits is discussed. It uses the original concept of probabilistic simulation to efficiently generate accurate estimates of the expected current waveform required for electromigration analysis. Thus, the approach is pattern-independent and relieves the designer of the tedious task of specifying logical input waveforms. This approach has been implemented in the program CREST (current estimator) which has shown excellent accuracy and dramatic speedups compared with traditional approaches. The approach and its implementation are described, and the results of numerous CREST runs on real circuits are presented.>

Key concepts: Very-large-scale integration, CMOS, Electromigration, Computer science, Probabilistic logic, Waveform, Estimator, Electronic circuit

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