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Phase detection of electrostatic force by AFM with a conductive tip

Takuji Takahashi, Takashi Kawamukai

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Key concepts: Kelvin probe force microscope, Electrostatic force microscope, Conductive atomic force microscopy, Amplitude, Volta potential, Non-contact atomic force microscopy, Atomic force acoustic microscopy, DC bias

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Phase detection of electrostatic force by AFM with a conductive tip — Research Paper | ScholarLens