2013Applied Mechanics and MaterialsOpen access

Measuring the Capability for One Process with Spherical Tolerance

Liang Chyau Sheu, Chi Huang Yeh, Ching Ho Yen, Chia Hao Chang

Open full text 0 citations

Abstract

Process capability indices, Cp, Cpk, and Cpm, are well-known indices used widely in the manufacturing industry for measuring process reproduction capability according to manufacturing specifications, but limited to cases with single engineering specification. Therefore, for processes where the quality characteristic is the location relative to a specific location, they can not provide an effective measure. In this paper, we propose a process loss index LG to evaluate the process capability for this issue. Based on the index, we provide the corresponding transformation for production yield. In addition, we tabulate some critical values for process loss index LG to judge if the process capability is capable. The proposed method is useful for the practitioners to measure the process loss and determine whether a process meets the present process yield requirement.

About this research paper

What this paper is about

Process capability indices, Cp, Cpk, and Cpm, are well-known indices used widely in the manufacturing industry for measuring process reproduction capability according to manufacturing specifications, but limited to cases with single engineering specification. Therefore, for processes where the quality characteristic is the location relative to a specific location, they can not provide an effective measure. In this paper, we propose a process loss index LG to evaluate the process capability for this issue. Based on the index, we provide the corresponding transformation for production yield. In addition, we tabulate some critical values for process loss index LG to judge if the process capability is capable. The proposed method is useful for the practitioners to measure the process loss and determine whether a process meets the present process yield requirement.

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Process capability indices, Cp, Cpk, and Cpm, are well-known indices used widely in the manufacturing industry for measuring process reproduction capability according to manufacturing specifications, but limited to cases with single engineering specification. Therefore, for processes where the quality characteristic is the location relative to a specific location, they can not provide an effective measure. In this paper, we propose a process loss index LG to evaluate the process capability for this issue. Based on the index, we provide the corresponding transformation for production yield. In addition, we tabulate some critical values for process loss index LG to judge if the process capability is capable. The proposed method is useful for the practitioners to measure the process loss and determine whether a process meets the present process yield requirement.

Key concepts: Process capability index, Process capability, Process (computing), Measure (data warehouse), Reliability engineering, Index (typography), Quality (philosophy), Work in process

Related papers

Back to paper searchBrowse research topicsOriginal source
Measuring the Capability for One Process with Spherical Tolerance — Research Paper | ScholarLens