Strategies and design principles in biomineralization

The high accuracy to the angular change of a crystalline specimen was applied to the studies of strain in multilayers [3].And then, many strain measurements at the interfaces of various multilayer materials have been successfully conducted.Recent years, strain analysis can be conducted using automatic analysis programs, which take account of dynamical diffraction effects [4].In the present review, the large angle technique is explained, analyses of stacking faults and dislocations are demonstrated and examples of strain measurements of semiconductor layer materials are presented .