Correlation between absorption and scattering imaging in optical materials (Abstract Only)

Absorption and scattering present local defects which can be imaged simultaneously in exactly the same conditions, allowing a precise study of correlation between absorption and scattering spatial variations in thin film materials and surfaces. Absorption A is linearly related to the extinction coefficient whereas scattering S is mainly due to surface profile and refractive index variations. Furthermore spatial frequencies involved in these variations take a great part in scattering. However imaginary and real parts of the complex index are related by KK relations, and correlation A/S depending on the wavelength can be expected. Simulations in fused silica are presented. Studies of correlation give information about nature of defects.