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Absolute determination of surface atomic concentration by Reflection Electron Energy-Loss Spectroscopy (REELS)

Z.L. Wang, Ray F. Egerton

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Key concepts: Reflection high-energy electron diffraction, Electron energy loss spectroscopy, Electron diffraction, Reflection (computer programming), Spectroscopy, Inelastic mean free path, Chemistry, Mean free path

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Absolute determination of surface atomic concentration by Reflection Electron Energy-Loss Spectroscopy (REELS) — Research Paper | ScholarLens