2010•MicronOpen access

Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics

I. A. Artyukov, Ruslan M. Feschenko, A. Vinogradov, Ye.A. Bugayev, O. Yu. Devizenko, В. В. Кондратенко, Yu. S. Kas’yanov, Tadashi Hatano, Masaki Yamamoto, S. V. Saveliev

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Key concepts: Materials science, Water window, Optics, Laser, Nanosecond, X-ray optics, Wavelength, Image resolution

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Soft X-ray imaging of thick carbon-based materials using the normal incidence multilayer optics — Research Paper | ScholarLens