2005•Acta MaterialiaRequires access

Surface tension of molten silicon measured by microgravity oscillating drop method and improved sessile drop method

Hidetoshi Fujii, Taihei Matsumoto, Shun Izutani, Shoji Kiguchi, Kiyoshi Nogi

Open publisher page 68 citations

Abstract

This record does not include an abstract. Use the full-text link above if available.

About this research paper

What this paper is about

An abstract is not available in the OpenAlex record for this paper.

Why it matters

OpenAlex reports 68 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Key concepts: Sessile drop technique, Drop (telecommunication), Materials science, Surface tension, Spinning drop method, Silicon, Analytical Chemistry (journal), Contact angle

Back to paper search Browse research topics Original source

Surface tension of molten silicon measured by microgravity oscillating drop method and improved sessile drop method — Research Paper | ScholarLens