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2004•SID Symposium Digest of Technical PapersRequires access

57.2: Extreme AMOLED Backplanes in a‐Si with Proven Stability

Arokia Nathan, Stefan Alexander, K. Sakariya, Peyman Servati, Tao Sheng, Denis Striakhilev, Anil Kumar, Sanjiv Sambandan, Shahin Jafarabadi Ashtiani, Yuri Vigranenko, Corbin Church, Jay Wzorek, Paul Arsenault

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Abstract

Abstract Instability has long been a barrier to the use of a‐Si AMOLED backplanes. We present here the first demonstration of proven stability of a‐Si AMOLED pixels. Over 7000h of stability data is shown for pixel circuits that compensate for threshold‐voltage shift, temperature, and OLED degradation (extreme compensation). This demonstrates that stable AMOLED backplanes are achievable using well‐established and proven a‐Si TFT technology in mainstream use by the flat panel display industry.

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What this paper is about

Abstract Instability has long been a barrier to the use of a‐Si AMOLED backplanes. We present here the first demonstration of proven stability of a‐Si AMOLED pixels. Over 7000h of stability data is shown for pixel circuits that compensate for threshold‐voltage shift, temperature, and OLED degradation (extreme compensation). This demonstrates that stable AMOLED backplanes are achievable using well‐established and proven a‐Si TFT technology in mainstream use by the flat panel display industry.

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Available abstract

Abstract Instability has long been a barrier to the use of a‐Si AMOLED backplanes. We present here the first demonstration of proven stability of a‐Si AMOLED pixels. Over 7000h of stability data is shown for pixel circuits that compensate for threshold‐voltage shift, temperature, and OLED degradation (extreme compensation). This demonstrates that stable AMOLED backplanes are achievable using well‐established and proven a‐Si TFT technology in mainstream use by the flat panel display industry.

Key concepts: AMOLED, Backplane, Materials science, OLED, Optoelectronics, Compensation (psychology), Pixel, Thin-film transistor

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