2013•CrystEngCommRequires access

Direct observations of the MOF (UiO-66) structure by transmission electron microscopy

Liangkui Zhu, Daliang Zhang, Ming Xue, Huan Li, Shilun Qiu

Abstract

As a demonstration of ab initio structure characterizations of nano metal organic framework (MOF) crystals by high resolution transmission electron microscopy (HRTEM) and electron diffraction tomography methods, a Zr-MOF (UiO-66) structure was determined and further confirmed by Rietveld refinements of powder X-ray diffraction. HRTEM gave direct imaging of the channels.

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Key concepts: High-resolution transmission electron microscopy, Transmission electron microscopy, Electron tomography, Electron diffraction, Materials science, Rietveld refinement, Crystallography, Diffraction