Photoluminescence determination of the nitrogen doping concentration in 6H-SiC
Anne Henry, Olof Kordina, Christer Hallin, Carl G. Hemmingsson, Erik Janzén
Abstract
Anne Henry, Olof Kordina, Christer Hallin, Carl G. Hemmingsson, Erik Janzén
Abstract
The intensity of impurity and intrinsic luminescence lines reflects the impurity doping concentration. A calibration procedure is presented for the nitrogen impurity in 6H–SiC. The calibration is valid for a large range of n-type doping from 1014 to 1016 cm−3. Effects of excitation density, temperature during the photoluminescence experiments as well as the observation of acceptor related lines are discussed.
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The intensity of impurity and intrinsic luminescence lines reflects the impurity doping concentration. A calibration procedure is presented for the nitrogen impurity in 6H–SiC. The calibration is valid for a large range of n-type doping from 1014 to 1016 cm−3. Effects of excitation density, temperature during the photoluminescence experiments as well as the observation of acceptor related lines are discussed.
Key concepts: Photoluminescence, Impurity, Doping, Materials science, Luminescence, Nitrogen, Calibration, Acceptor