1994Applied Physics LettersRequires access

Photoluminescence determination of the nitrogen doping concentration in 6H-SiC

Anne Henry, Olof Kordina, Christer Hallin, Carl G. Hemmingsson, Erik Janzén

Open publisher page 34 citations

Abstract

The intensity of impurity and intrinsic luminescence lines reflects the impurity doping concentration. A calibration procedure is presented for the nitrogen impurity in 6H–SiC. The calibration is valid for a large range of n-type doping from 1014 to 1016 cm−3. Effects of excitation density, temperature during the photoluminescence experiments as well as the observation of acceptor related lines are discussed.

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What this paper is about

The intensity of impurity and intrinsic luminescence lines reflects the impurity doping concentration. A calibration procedure is presented for the nitrogen impurity in 6H–SiC. The calibration is valid for a large range of n-type doping from 1014 to 1016 cm−3. Effects of excitation density, temperature during the photoluminescence experiments as well as the observation of acceptor related lines are discussed.

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Available abstract

The intensity of impurity and intrinsic luminescence lines reflects the impurity doping concentration. A calibration procedure is presented for the nitrogen impurity in 6H–SiC. The calibration is valid for a large range of n-type doping from 1014 to 1016 cm−3. Effects of excitation density, temperature during the photoluminescence experiments as well as the observation of acceptor related lines are discussed.

Key concepts: Photoluminescence, Impurity, Doping, Materials science, Luminescence, Nitrogen, Calibration, Acceptor

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