2012Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access

Investigation of birefringence uniformity of mid-IR nonlinear optical crystals

Benjamin Johnson, Kevin T. Zawilski, Peter G. Schunemann, P. Randall Staver, T. M. Pollak, Evan P. Chickilis

Open publisher page 3 citations

Abstract

An investigation of the birefringence uniformity of mid-IR non-linear optical crystals has been conducted in an effort to improve the performance of crystals used in OPO converters. This paper discusses the development of an imaging polarimeter operating at 2 μm for the characterization of birefringence uniformity of nonlinear optical crystals for use in mid-IR generation. The spatial distribution of optical in-homogeneity is directly revealed in terms of optical rotation in the polarimeter. The root cause for the optical rotation observed in the polarimeter is discussed in terms of fluctuations in the material birefringence, or excess birefringence. Excess birefringence on the order of ▵n=10-4 are measured in samples exhibiting the rare occurrence of low birefringence uniformity in our mid-IR nonlinear optical crystals.

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What this paper is about

An investigation of the birefringence uniformity of mid-IR non-linear optical crystals has been conducted in an effort to improve the performance of crystals used in OPO converters. This paper discusses the development of an imaging polarimeter operating at 2 μm for the characterization of birefringence uniformity of nonlinear optical crystals for use in mid-IR generation. The spatial distribution of optical in-homogeneity is directly revealed in terms of optical rotation in the polarimeter. The root cause for the optical rotation observed in the polarimeter is discussed in terms of fluctuations in the material birefringence, or excess birefringence. Excess birefringence on the order of ▵n=10-4 are measured in samples exhibiting the rare occurrence of low birefringence uniformity in our mid-IR nonlinear optical crystals.

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Available abstract

An investigation of the birefringence uniformity of mid-IR non-linear optical crystals has been conducted in an effort to improve the performance of crystals used in OPO converters. This paper discusses the development of an imaging polarimeter operating at 2 μm for the characterization of birefringence uniformity of nonlinear optical crystals for use in mid-IR generation. The spatial distribution of optical in-homogeneity is directly revealed in terms of optical rotation in the polarimeter. The root cause for the optical rotation observed in the polarimeter is discussed in terms of fluctuations in the material birefringence, or excess birefringence. Excess birefringence on the order of ▵n=10-4 are measured in samples exhibiting the rare occurrence of low birefringence uniformity in our mid-IR nonlinear optical crystals.

Key concepts: Birefringence, Materials science, Nonlinear optics, Optics, Optical materials, Nonlinear optical, Optoelectronics, Nonlinear system

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