Analysis of multilayer substrates by multilayer contribution of wave concept iterative process

Abstract An efficient iterative technique based on the concept of wave is presented for computing multilayer substrates. This article presents an extensible approach of the iterative method to study substrates with n layers. To validate our theory, we intend to study multilayer dielectric substrates. The approach involves the mixed magnetic and electric filed equation technique and the multilayer contribution of wave concept iterative process, which involves S‐parameters extraction technique based on a simple form of Matched Load Simulation. In this sense, a program in FORTRAN has been elaborated to determine different parameters Sijcharacterizing the studied structure. The numerical results are compared with the published data. Good agreement will be important to establish the validity and usefulness of the iterative method given in this article. © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 1439–1445, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22406