1987•Journal of Crystal GrowthRequires access

Assessment of band offsets in Si/SiGe strained layer superlattices by vertical transport measurements

Helmut Jorke, H.-J. Herzog, Erich Kasper, Horst Kibbel

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Key concepts: Superlattice, Band offset, Condensed matter physics, Materials science, Molecular beam epitaxy, Ohmic contact, Optoelectronics, Layer (electronics)

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Assessment of band offsets in Si/SiGe strained layer superlattices by vertical transport measurements — Research Paper | ScholarLens