1998Journal of Applied PhysicsOpen access

Electronic band structures and effective-mass parameters of wurtzite GaN and InN

Yee‐Chia Yeo, Tow Chong Chong, M. F. Li

Open full text 306 citations

Abstract

The electronic band structures of wurtzite GaN and InN are calculated by the empirical pseudopotential method (EPM) with the form factors adjusted to reproduce band features which agree with recent experimental data and accurate first-principles calculations. The electron and hole effective masses at the Γ point are obtained using a parabolic line fit. Further, using the effective-mass Hamiltonian and the cubic approximation for wurtzite semiconductors, band edge dispersion at the Γ point obtained using the k.p method is fitted to that calculated using the EPM by adjusting the effective-mass parameters. Thus, we derived important band structure parameters such as the Luttinger-like parameters for GaN and InN which will be useful for material design in wide-gap nitride-based semiconductor lasers employing InGaN. The results also showed that the cubic approximation is fairly successful in the analysis of valence band structures for wurtzite nitrides.

Open-access reader

About this research paper

What this paper is about

The electronic band structures of wurtzite GaN and InN are calculated by the empirical pseudopotential method (EPM) with the form factors adjusted to reproduce band features which agree with recent experimental data and accurate first-principles calculations. The electron and hole effective masses at the Γ point are obtained using a parabolic line fit. Further, using the effective-mass Hamiltonian and the cubic approximation for wurtzite semiconductors, band edge dispersion at the Γ point obtained using the k.p method is fitted to that calculated using the EPM by adjusting the effective-mass parameters. Thus, we derived important band structure parameters such as the Luttinger-like parameters for GaN and InN which will be useful for material design in wide-gap nitride-based semiconductor lasers employing InGaN. The results also showed that the cubic approximation is fairly successful in the analysis of valence band structures for wurtzite nitrides.

Why it matters

OpenAlex reports 306 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

The electronic band structures of wurtzite GaN and InN are calculated by the empirical pseudopotential method (EPM) with the form factors adjusted to reproduce band features which agree with recent experimental data and accurate first-principles calculations. The electron and hole effective masses at the Γ point are obtained using a parabolic line fit. Further, using the effective-mass Hamiltonian and the cubic approximation for wurtzite semiconductors, band edge dispersion at the Γ point obtained using the k.p method is fitted to that calculated using the EPM by adjusting the effective-mass parameters. Thus, we derived important band structure parameters such as the Luttinger-like parameters for GaN and InN which will be useful for material design in wide-gap nitride-based semiconductor lasers employing InGaN. The results also showed that the cubic approximation is fairly successful in the analysis of valence band structures for wurtzite nitrides.

Key concepts: Wurtzite crystal structure, Pseudopotential, Effective mass (spring–mass system), Band gap, Materials science, Wide-bandgap semiconductor, Electronic band structure, Semiconductor

Related papers

Back to paper searchBrowse research topicsOriginal source
Electronic band structures and effective-mass parameters of wurtzite GaN and InN — Research Paper | ScholarLens