2004•SID Symposium Digest of Technical PapersRequires access

P‐55: A High Accuracy Instrument for Measuring Both In‐Plane and Out‐Of‐Plane Birefringence in Birefringence Films

Baoliang Wang, Jennifer List

Abstract

Abstract We report in this paper a new instrument, known as the Exicor ® birefringence measurement system, that measures both in‐plane and out‐of‐plane (vertical) birefringence in birefringence films. This instrument can be used as a quality control (QC) tool for birefringence film suppliers to test the accuracy and uniformity of their products. It can also be used as a research tool to study birefringence in birefringence films and their effects on LCD performance.

About this research paper

What this paper is about

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

Key concepts: Birefringence, Materials science, Optics, Plane (geometry), Quality (philosophy), Physics, Mathematics, Geometry