2006•Microelectronic EngineeringRequires access

Characterization of post-copper CMP surface with scanning probe microscopy: Part II: Surface potential measurements with scanning Kelvin probe force microscopy

A. Dominget, J. Farkas, Sabine Szunerits

Open publisher page 8 citations

Abstract

This record does not include an abstract. Use the full-text link above if available.

About this research paper

What this paper is about

An abstract is not available in the OpenAlex record for this paper.

Why it matters

OpenAlex reports 8 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Key concepts: Kelvin probe force microscope, Copper, Scanning probe microscopy, Microscopy, Conductive atomic force microscopy, Wafer, Volta potential, Scanning ion-conductance microscopy

Back to paper search Browse research topics Original source

Characterization of post-copper CMP surface with scanning probe microscopy: Part II: Surface potential measurements with scanning Kelvin probe force microscopy — Research Paper | ScholarLens