2013•Journal of Electronic TestingRequires access

Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction

Lung‐Jen Lee

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Key concepts: Automatic test pattern generation, Scan chain, Test compression, Fault coverage, Test vector, Benchmark (surveying), Reduction (mathematics), Observability

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Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction — Research Paper | ScholarLens