1958•IRE Transactions on Reliability and Quality ControlRequires access

Utilization of Component Part Reliability Information in Circuit Design

M. A. Xavier, L. L. Schneider, Paul Gottfried

Abstract

Component part reliability testing programs of varying scope are in progress in many areas of the electronics industry today. These programs differ in magnitude, levels of environmental and electrical stress, and types of component parts tested, but properly designed programs have one aspect in common: They can result not only in reliability evaluation, but also in reliability improvement. This paper will discuss techniques for optimizing circuit reliability by application of component characteristic data obtained from reliability testing.

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Available abstract

Key concepts: Reliability (semiconductor), Component (thermodynamics), Reliability engineering, Scope (computer science), Electronics, Computer science, Electronic component, Circuit reliability