1996Applied OpticsRequires access

Cross-shaped bandpass filters for the near- and mid-infrared wavelength regions

K. D. Möller, J. B. Warren, James B. Heaney, Carl A. Kotecki

Open publisher page 39 citations

Abstract

A photolithographic process has been used to form cross-shaped patterns in 3-μm-thick nickel foils. Patterns with cross arm dimensions in the 10-20-μm range, and with periodicities in the 16-26-μm range, yield self-resonant bandpass filters for wavelengths in the 20-25-μm region. Transmittances as high as 80% were achieved with center wavelength-to-bandwidth ratios (λ(R)/Δλ) of ~5. We present a simple empirical formula that relates the wavelength of peak transmittance, or resonant frequency, with cross dimensions and periodicity.

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A photolithographic process has been used to form cross-shaped patterns in 3-μm-thick nickel foils. Patterns with cross arm dimensions in the 10-20-μm range, and with periodicities in the 16-26-μm range, yield self-resonant bandpass filters for wavelengths in the 20-25-μm region. Transmittances as high as 80% were achieved with center wavelength-to-bandwidth ratios (λ(R)/Δλ) of ~5. We present a simple empirical formula that relates the wavelength of peak transmittance, or resonant frequency, with cross dimensions and periodicity.

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Available abstract

A photolithographic process has been used to form cross-shaped patterns in 3-μm-thick nickel foils. Patterns with cross arm dimensions in the 10-20-μm range, and with periodicities in the 16-26-μm range, yield self-resonant bandpass filters for wavelengths in the 20-25-μm region. Transmittances as high as 80% were achieved with center wavelength-to-bandwidth ratios (λ(R)/Δλ) of ~5. We present a simple empirical formula that relates the wavelength of peak transmittance, or resonant frequency, with cross dimensions and periodicity.

Key concepts: Optics, Band-pass filter, Wavelength, Transmittance, Materials science, Optical filter, Bandwidth (computing), Physics

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