1959•The Journal of Chemical PhysicsRequires access
Probability of Double Ionization by Electron Impact for Neon, Argon, and Xenon
J. D. Morrison, A. J. C. Nicholson
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Abstract
The ionization efficiency curves for the double ionization by electron impact of Ne, Ar, and Xe have been re-examined. It is shown that, near the threshold, the probability of double ionization varies as the square of the excess electron energy. Upper states of the ions are detected and the determination of appearance potentials for such processes is discussed.